Second-hand Equipment

JSM-6610LV

Compact, high resolution scanning electron microscope with large specimen chamber. Low vacuum operating mode and a variety of automatic functions (focus, contrast/brightness, astigmatism correction, source and column adjustment).

JEOL Scanning electron microscope from our applications laboratory

SM-09010

Easy-to-operate preparation system for producing high-quality specimen cross-sections for SEM, EPMA and auger applications.

JEOL Cross section polisher
from our applications laboratory

JSM-7500F

High resolution field emission scanning electron microscope.

JEOL Scanning electron microscope with cold FEG from our applications laboratory

JMS-100 GCv (AccuTOFGCv)

High Resolution GC TOF mass spectrometer with various ionisation techniques.

JEOL mass spectrometer from our applications laboratory.

JEOL JCM-5000, NeoScope™

Compact and high performance table SEM which combines the advantages of optical microscopes and traditional scanning electron microscopes.

Various automatic functions (focus, contrast and brightness). Easy handling makes it possible even for novices to quickly achieve optimal results. There is no need for special specimen preparations such as coating of the specimen. High vacuum mode as well as low vacuum mode with the option of three possible settings for the acceleration voltage for a wide range of applications.