Element Analyzer Systems

Standard modern Scanning Electron Microscopes and Transmission Electron Microscopes are in most cases equipped with an integrated X-Ray Spectrometer. The fully integrated analysis system, which had successfully been installed for electron beam microprobes, can now be offered for JEOL Scanning Electron Microscopes and Transmission Electron Microscopes.

As one of the biggest manufacturers of systems for energy dispersive X-Ray analytics, JEOL also offers efficient X-Ray Fluorescence Spectrometers. JEOL X-Ray Fluorescence Spectrometers perform the highly sensitive detection and quantification of micronutrients as well as elemental analysis to ensure electric and electronic devices meet regulations for hazardous substances.

Element Analyzer Systems

Electron Beam Microprobe Analyzers (EPMA)
X-ray Analytics