X-ray Analytics

The product range of JEOL X-ray analysis systems includes energy and wavelength dispersive systems as well as systems for X-ray fluorescence analytics.

For additional product information, please select a model from the following list.

Wavelength dispersive X-ray Element Analytics (WDS)
JEOL electron beam microprobes feature highly stable electron optics in connection with wavelength dispersive crystal spectrometers (WDS) for the x-ray microanalysis of solid specimens of any type. The range of elements that can be analyzed ranges from beryllium to uranium.
To section "Electron Beam Microprobes"

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.