Transmission Electron Microscopes (TEM)

Since 1949, JEOL has been developing and producing state-of-the-art transmission electron microscopes. The current product line consists of instruments with acceleration voltages from 100 kV to 1.3 MV for a wide range of applications.

With acceleration voltages between 200 kV and 1.3 MV, JEOL TEMs allow for routine imaging of atomic structures for materials science and semiconductor research. By using energy dispersive X-ray analysis (EDS) and electron energy loss spectroscopy (EELS), the TEM becomes an analysis tool and can deliver element analyses in ranges down to the atomic level.

The JEOL transmission electron microscopes (TEM) are also used in biology and biomedicine due to their nearly unmatched options for the imaging of very fine cell and virus structures. JEOL TEMs are an indispensable tool for diagnosis in pathology.

With the integration of state-of-the-art developments JEOL TEMs are optimized for a great variety of applications.

JEOL TEMs with an integrated energy filter offer high contrast images of even very thick specimens and images of element distributions in a live image.

Liquid N2 and liquid He cooled specimen holders and goniometers enable analyses of extremely sensitive specimen.

All JEOL TEMs with tomography specimen holders and JEOL tomography software permit the reconstruction of three-dimensional specimen structures. The piezo controlled JEOL specimen goniometers are indispensable precondition for the acquisition of high quality image series.

With the implementation of correctors in TEM and STEM mode the resolution in imaging and analysis has been improved up to the theoretically possible limits.

TEMs with 100 and 120 kV Acceleration Voltage
TEMs and FEG-TEMs with 200 kV Acceleration Voltage
TEMs and FEG-TEMs with 300 kV Acceleration Voltage
MeV TEMs

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.