JEOL Focused Ion Beam Systems (FIB)

Based on the proven JEOL electron and ion optical devices, JEOL developed FIB systems providing the opportunity to produce fast and precise cross section specimen for TEM and SEM applications.

There are not only systems available with an ion source for preparation and imaging, but also two beam devices which feature a combined electron column and FIB source. Effective software packages for the automated FIB preparation as well as for FIB tomography complete the JEOL FIB product line.

You are interested in upgrading your electron optical microscope by installing a FIB-system? JEOL offers the right solutions for it.

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For additional product information, please select a model from the following list.

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.