JEOL - JEOL Auger Micro Probes (JAMP)

JEOL Auger Micro Probes (JAMP)

JEOL has extensive experience in developing Auger micro probes.
Many JEOL customers have a very positive experience with the equipment generations JAMP-3, JAMP-10, JAMP-30 and JAMP-7800.

In addition to the advanced development of JAMP-7810, JEOL also offers the Auger probe JAMP-9500F with a field emission electron beam source.

 

Models:

For additional product information, please select a model from the following list.

  • JEOL JAMP-9500F Auger Micro Probe

    JEOL JAMP-9500F Auger Micro Probe

    With 8 nm, the new field emissions Auger probe JAMP-9500F offers the best lateral analytical resolution worldwide. The resolution of 3 nm in imaging mode additionally highlights the benefits of a field emissions beam source as compared to conventional LaB6 sources …

 

Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.

 

Exhibition Dates

  • Scandem

    12.06. - 15.06.2012 in Bergen, Norway

    63rd annual meeting of SCANDEM, the Nordic microscopy society

  • Euromar 2012

    01.07. - 05.07.2012 in Dublin, Ireland

    Annual international conference on Magnetic Resonance

  • Ultrapath XVI

    06.08. - 10.08.2012 in Regensburg, Germany

    Conference on Diagnostic Microscopy Basic Research & Oncology, located at the University Medical Center in Regensburg, Germany

All dates