JEOL Q-SEM Series – Analytical Scanning Electron Microscopes

09.07.2011

The scanning electron microscopes in the Q-SEM Series offer outstanding performance and ease of use. They were designed to meet the sophisticated quality assurance requirements both of the academic and industrial world.

The JEOL Q-SEM Series makes it possible to generate detailed surface images and laterally resolved element analyses and to produce a 3D reconstruction of the work piece within only a few minutes.

The diversity of Q-SEM application areas can also be seen in the extensive areas of possible sample specifications. Specimens of up to 300 mm and 5 kg can be analyzed in the exceptionally large chamber of the JSM-6610 Q-SEM. A resolution of better than 3 nm is achieved here. The eucentric specimen stage offers a safe and fast way to obtain stereo images for 3-D imaging.

The Q-SEM package extends the proven JEOL JSM-6x10 series with an integrated high-performance EDS analysis system. Since all of the process sequences on the Q-SEM run on a PC, the functions interact seamlessly and comfortably. The two monitors - one for the SEM and the other for the element analysis - provide a large space for efficient work. The smooth operation of the two displays with the same mouse gives the impression of a super wide screen monitor.

An intuitive user interface, automatic functions and defined single steps for analyses provide optimal user support. Thus even users with little experience can create impressive images and chemical analyses for quality control in minimal time - meanwhile experienced users have all options they need for customization.

Subject to technical changes, errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.